Songjie Luo, Osami Sasaki, Samuel Choi, Takamasa Suzuki, and Jixiong Pu. “Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement”, Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190N (8 November 2018);
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上一条：Songjie Luo, Yongxin Liu, Osami Sasaki, and Jixiong Pu. “Signal processing in white-light scanning interferometry by Fourier transform and its application to surface profile measurements”, Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100230V (24 November 2016).
下一条：Songjie Luo, Osami Sasaki, Yongxin Liu, Xiaoyan Li, Zhili Lin, and Jixiong Pu, Elimination of dispersion effect in a white-light scanning interferometer by using a spectral analyzer, 2017, Optical Review, 24(1), 27-32.
