Changsheng Ji, Songjie Luo*, Osami Sasaki, Ziyang Chen and Jixiong Pu,Exact surface measurement based on phase error insensitive method for white-light scanning interferometer[J]. Surface Topography: Metrology and Properties, 2024, 12(2), 025025.
Date:2026-03-13 clicks:
Translation or Not:no



