- Luo Songjie, Liu Yongxin, Pu Jxiong, Gao Zenghui, Experimental Measurement of the Generalized Stokes Parameters of a Random Electromagnetic Beam, Acta Photonica Sinica, 2016, 45(2):226003..
- Songjie Luo, Yongxin Liu, Osami Sasaki, and Jixiong Pu. “Signal processing in white-light scanning interferometry by Fourier transform and its application to surface profile measurements”, Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100230V (24 November 2016)..
- Songjie Luo, Osami Sasaki, Samuel Choi, Takamasa Suzuki, and Jixiong Pu. “Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement”, Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190N (8 November 2018); .
- Songjie Luo, Osami Sasaki, Yongxin Liu, Xiaoyan Li, Zhili Lin, and Jixiong Pu, Elimination of dispersion effect in a white-light scanning interferometer by using a spectral analyzer, 2017, Optical Review, 24(1), 27-32..
- Songjie Luo, Osami Sasaki , Ziyang Chen, and Jixiong Pu, Utilization of complex-valued signals in a white-light scanning interferometer for accurate measurement of a surface profile, Applied Optics, 2017, 56(15), 4419-4425..
- Songjie Luo, Osami Sasaki, Ziyang Chen, Samuel Choi, and Jixiong Pu, Exact surface profile measurement without subtracting dispersion phase through Fourier transform in a white-light scanning interferometer, Applied Optics, 2018, 57(4), 894-899..
- Songjie Luo, Takamasa Suzuki, Osami Sasaki, Samuel Choi, Ziyang Chen, and Jixiong Pu, Signal correction by detection of scanning position in a white-light interferometer for exact surface profile measurement, Applied Optics, 2019, 58(13), 3548-3554..
- Kaining Zhang, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Yongxin Liu, and Jixiong Pu, A dual-scanning white-light interferometer for exact thickness measurement of a large-thickness glass plate, Measurement Science and Technology, 2020, 31, 045009..
- Kaining Zhang, Samuel Choi, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Yongxin Liu and Jixiong Pu, Large thickness measurement of glass plates with a spectrally resolved interferometer using variable signal positions, Physics, Engineering SPIE/COS Photonics Asia, 2021..
- Kaining Zhang, Osami Sasaki, Samuel Choi, Songjie Luo, Takamasa Suzuki, and Jixiong Pu, Measurement of phase refractive index directly from phase distributions detected with a spectrally resolved interferometer, Applied Optics, 2021, 60(31): 10009-10015..