Songjie Luo, Takamasa Suzuki, Osami Sasaki, Samuel Choi, Ziyang Chen, and Jixiong Pu, Signal correction by detection of scanning position in a white-light interferometer for exact surface profile measurement, Applied Optics, 2019, 58(13), 3548-3554.

Date:2026-03-13 clicks:

Translation or Not:no

Pre One:Songjie Luo, Osami Sasaki, Ziyang Chen, Samuel Choi, and Jixiong Pu, Exact surface profile measurement without subtracting dispersion phase through Fourier transform in a white-light scanning interferometer, Applied Optics, 2018, 57(4), 894-899. Next One:Kaining Zhang, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Yongxin Liu, and Jixiong Pu, A dual-scanning white-light interferometer for exact thickness measurement of a large-thickness glass plate, Measurement Science and Technology, 2020, 31, 045009.