Songjie Luo, Osami Sasaki, Ziyang Chen, Samuel Choi, and Jixiong Pu, Exact surface profile measurement without subtracting dispersion phase through Fourier transform in a white-light scanning interferometer, Applied Optics, 2018, 57(4), 894-899.

Date:2026-03-13 clicks:

Translation or Not:no

Pre One:Songjie Luo, Osami Sasaki , Ziyang Chen, and Jixiong Pu, Utilization of complex-valued signals in a white-light scanning interferometer for accurate measurement of a surface profile, Applied Optics, 2017, 56(15), 4419-4425. Next One:Songjie Luo, Takamasa Suzuki, Osami Sasaki, Samuel Choi, Ziyang Chen, and Jixiong Pu, Signal correction by detection of scanning position in a white-light interferometer for exact surface profile measurement, Applied Optics, 2019, 58(13), 3548-3554.