Songjie Luo, Osami Sasaki, Samuel Choi, Takamasa Suzuki, and Jixiong Pu. “Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement”, Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190N (8 November 2018);

Date:2026-03-13 clicks:

Translation or Not:no

Pre One:Songjie Luo, Yongxin Liu, Osami Sasaki, and Jixiong Pu. “Signal processing in white-light scanning interferometry by Fourier transform and its application to surface profile measurements”, Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100230V (24 November 2016). Next One:Songjie Luo, Osami Sasaki, Yongxin Liu, Xiaoyan Li, Zhili Lin, and Jixiong Pu, Elimination of dispersion effect in a white-light scanning interferometer by using a spectral analyzer, 2017, Optical Review, 24(1), 27-32.